高温高压和控制氧逸度条件下透辉石电导率的各向异性实验研究
In situ control of oxygen fugacity experimental study on the crystallographic anisotropy of the electrical conductivities of diopside at high temperature and high pressure
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摘要: 在1.0~4.0GPa 和1073~1373K 及控制氧分压条件下,借助于 YJ-3000t 紧装式六面顶固体高压设备和1260阻抗/增益-相位分析仪,就位测定了沿着不同晶轴方向的透辉石的电导率。氧逸度控制是由 Ni+NiO 固体缓冲剂完成的。实验结果表明:(1)在选择的频率范围,无论从复阻抗的模与频率还是从相角与频率关系上,部可以看出复阻抗对频率具有很强的依赖性;(2)随着温度升高,阻抗降低,电导率增大,Logo 与1/T 之间符合 Arrenhius 线性关系式;(3)随着压力升高,[001]方向的透辉石电导率降低,活化焓和指前因子亦随之减小,并首次获得了透辉石中主要载流子的活化能和活化体积分别为1.80±0.04eV 和0.035±0.015cm~3/mol;(4)在2.0GPa 下按照[001]、[100]、[010]的顺序,样品的电导率和指前因子降低,活化焓依次升高,高压下的透辉石电学性质存在各向异性;(5)小极化子导电机制可为透辉石在高温高压下的导电行为提供合理的解释。
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Key words:
- Diopside /
- High temperature and high pressure /
- Electrical conductivity /
- Oxygen fugacity /
- Anisotropy /
- Small polaron
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